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MICAP-OES 1000
Microwave Inductively Coupled Atmospheric Plasma
Optical Emission Spectrometer

THE ALL-NEW MICAP-OES 1000

Unparalleled SAFER, FASTER, and EASIER technology.

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Designed and Assembled in the USA!

Cerawave™ in atomic spectroscopy delivers immediate cost Savings and lowers carbon footprint. Radom’s MICAP-OES 1000 is significantly smaller than the dimensions of similar technology.

The World’s Smallest ICP

Smaller. Cleaner. On-location results.

Radom’s MICAP-OES 1000 is significantly smaller than the dimensions of similar technology. It is compact, easy-to-use and install.

How Does It Work?

See the Smart Technology Behind.

Watch our video demonstration on how MICAP-OES 1000, powered by Cerawave, provides easy access to faster, smarter and easier trace metal analysis.

Optical Emission Spectrometer

Echelle based spectrometer with fiber optic connection.

Air cooled Microwave plasma source of 1000 W reliably generated and sustained with patented Cerwave technology and runs on nitrogen. No chiller required.

Echelle spectrometer simultaneously measures the entire wavelength range with every solution injection.

Aperture:f/10
Wavelength range: 194 nm – 625 nm + 766 nm
Simultaneous:up to 625 nm
Slit Width: 30 um slit
Resolution:5pm - 30 pm

Dell Latitude with i5core and 1TB HDD memory with RIS™ pre-installed

Radom Intuitive Software (RIS™)

See behind the smart technology:

  • Minimal screens and maximized workflow for organizing, collecting, and analyzing data.
  • Extensive proprietary nitrogen-based line library with interference correction integrated autosampler.
  • Full spectrum acquisition enables a complete set of data processing.

Optimize your performance and reimagine plasma with Radom.

CONTACT US
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radomcorp.com

(877) 977-2366

inquiries@radomcorp.com

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Radom, the Radom logo and all referenced products names are trademarks or registered trademarks of Radom Corporation. All other company names and products mentioned herein are trademarks or registered trademarks of their respective companies.

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